Saha, Sayandeep, Debdeep Mukhopadhyay, and Pallab Dasgupta. “ExpFault: An Automated Framework for Exploitable Fault Characterization in Block Ciphers”. IACR Transactions on Cryptographic Hardware and Embedded Systems 2018, no. 2 (May 8, 2018): 242–276. Accessed January 15, 2025. https://tosc.iacr.org/index.php/TCHES/article/view/882.