FADAEINIA, Bijan; MOOS, Thorben; MORADI, Amir. Static Leakage in Dual-Rail Precharge Logics. IACR Transactions on Cryptographic Hardware and Embedded Systems, [S. l.], v. 2024, n. 4, p. 509–540, 2024. DOI: 10.46586/tches.v2024.i4.509-540. Disponível em: https://tosc.iacr.org/index.php/TCHES/article/view/11801.. Acesso em: 15 jan. 2025.